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https://hdl.handle.net/10356/91842| Title: | Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals | Authors: | Liu, Zhen Chen, Tupei Liu, Yang Ding, Liang Yang, Ming Wong, Jen It Cen, Zhan Hong Li, Yibin Zhang, Sam Fung, Stevenson Hon Yuen |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics | Issue Date: | 2008 | Source: | Liu, Z., Chen, T. P., Liu, Y., Ding, L., Yang, M., Wong, J. I., et al. (2008). Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals. Applied Physics Letters, 92, 1-3. | Series/Report no.: | Applied physics letters | Abstract: | Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc-Al/AlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination. | URI: | https://hdl.handle.net/10356/91842 http://hdl.handle.net/10220/6402 |
ISSN: | 0003-6951 | DOI: | 10.1063/1.2828691 | Schools: | School of Electrical and Electronic Engineering | Rights: | Applied Physics Letters © copyright 2008 American Institute of Physics. The journal's website is located at http://apl.aip.org/applab/v92/i1/p013102_s1?isAuthorized=no | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
| Appears in Collections: | EEE Journal Articles |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals.pdf | 342.86 kB | Adobe PDF |  View/Open |
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