Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/92034
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tay, Cho Jui | en |
dc.contributor.author | Miao, Hong | en |
dc.contributor.author | Fu, Yu | en |
dc.date.accessioned | 2010-11-23T08:45:45Z | en |
dc.date.accessioned | 2019-12-06T18:16:09Z | - |
dc.date.available | 2010-11-23T08:45:45Z | en |
dc.date.available | 2019-12-06T18:16:09Z | - |
dc.date.copyright | 2005 | en |
dc.date.issued | 2005 | en |
dc.identifier.citation | Tay, C. J., Miao, H., & Fu, Y. (2005). Optical edge-projection method for three dimensional profilometry. Optics Letters, 30(20), 2718-2720. | en |
dc.identifier.issn | 0146-9592 | en |
dc.identifier.uri | https://hdl.handle.net/10356/92034 | - |
dc.description.abstract | A novel optical edge-projection method is proposed for surface contouring of an object with low reflectivity. A structured light edge is projected onto a dark surface, and the image is captured by a CCD camera. The object contour is evaluated with an active triangular projection algorithm, and one obtains a whole-field three-dimensional contour of the object by scanning the optical edge over the entire object surface. The proposed method is applied to a black nonreflective object made from woven carbon fiber and is also applied to measure the profile of a small object (a coin). The results show that an accurate profile of the specimen can be obtained. | en |
dc.format.extent | 3 p. | en |
dc.language.iso | en | en |
dc.relation.ispartofseries | Optics Letters | en |
dc.rights | This paper was published in [Optics Letters] and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: [http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-20-2718]. Systematic or multiple reproduction or distribution to multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law. | en |
dc.subject | DRNTU::Science::Physics::Optics and light | en |
dc.title | Optical edge-projection method for three dimensional profilometry | en |
dc.type | Journal Article | en |
dc.contributor.research | Temasek Laboratories | en |
dc.identifier.doi | 10.1364/OL.30.002718 | en |
dc.description.version | Published version | en |
item.fulltext | With Fulltext | - |
item.grantfulltext | open | - |
Appears in Collections: | TL Journal Articles |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Optical edge-projection method for three dimensional profilometry.pdf | 378.32 kB | Adobe PDF | View/Open |
SCOPUSTM
Citations
50
1
Updated on Feb 19, 2024
Page view(s) 5
1,059
Updated on Mar 28, 2024
Download(s) 5
594
Updated on Mar 28, 2024
Google ScholarTM
Check
Altmetric
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.