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dc.contributor.authorMiao, Hongen
dc.contributor.authorQuan, Chenggenen
dc.contributor.authorTay, Cho Juien
dc.contributor.authorFu, Yuen
dc.identifier.citationMiao, H., Quan, C., Tay, C. J., & Fu, Y. (2006). Analysis of phase distortion in phase-shifted fringe projection. Optics and Lasers in Engineering, 45(2), 318-338.en
dc.description.abstractThis paper describes the analysis of phase distortion in phase-shifted fringe projection method. A phase distortion occurs when the phase shifting technique is applied to extract the phase values from projected fringe patterns in surface contouring. The phase distortion will induce measurement errors especially in the measurement of micro-components. The cause of such phase distortion is investigated and the influence of phase distortion on the measurement of micro-components is discussed. To eliminate the phase distortion, a continuous wavelet transform (CWT) is employed to extract phase values from object surface modulated fringe patterns. Principle of the proposed CWT phase extraction method is described and experiments are conducted to verify the proposed method. It is shown that by the use of CWT phase extraction method phase distortion induced in conventional phase-shifting technique can be completely eliminated.en
dc.format.extent21 p.en
dc.relation.ispartofseriesOptics and Lasers in Engineeringen
dc.rightsThis is the author created version of a work that has been peer reviewed and accepted for publication by Optics and Lasers in Engineering, Elsevier. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [DOI:]en
dc.subjectDRNTU::Science::Physics::Optics and lighten
dc.titleAnalysis of phase distortion in phase-shifted fringe projectionen
dc.typeJournal Articleen
dc.contributor.researchTemasek Laboratoriesen
dc.description.versionAccepted versionen
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