Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/92669
Full metadata record
DC FieldValueLanguage
dc.contributor.authorLi, Qiangen
dc.contributor.authorZhu, Yimeien
dc.contributor.authorSu, Haibinen
dc.contributor.authorFischer, D. A.en
dc.contributor.authorMoodenbaugh, A. R.en
dc.contributor.authorGu, G. D.en
dc.contributor.authorWelch, David O.en
dc.contributor.authorDavenport, James W.en
dc.date.accessioned2011-07-11T03:49:00Zen
dc.date.accessioned2019-12-06T18:26:57Z-
dc.date.available2011-07-11T03:49:00Zen
dc.date.available2019-12-06T18:26:57Z-
dc.date.copyright2006en
dc.date.issued2006en
dc.identifier.citationFischer, D. A., Moodenbaugh, A. R., Li, Q., Gu, G. D., Zhu, Y., Davenport, J. W., et al. (2006). Soft X-Ray absorption spectroscopy of the MgB2 boron K edge in an MgB2/Mg composite. Modern Physics Letters B, 20(19), 1207-1216.en
dc.identifier.urihttps://hdl.handle.net/10356/92669-
dc.identifier.urihttp://hdl.handle.net/10220/6878en
dc.description.abstractSoft X-ray absorption spectroscopy (XAS), using uorescence yield, was used to study the boron K near edge in MgB2 superconductor. The sample consists of MgB2 crystallites randomly oriented in a magnesium matrix. Abrasion of the sample surface in vacuum provides a surface relatively free of boron-containing impurities. The intrinsic boron K near edge spectrum of the sample at a temperature of 295 K is identified. This spectrum is then compared in detail with a spectrum calculated using the full potential linearized augmented plane wave method. Features predicted by the theory appear near the expected energies, with qualitative agreement regarding shape and intensity.en
dc.format.extent20 p.en
dc.language.isoenen
dc.relation.ispartofseriesModern physics letters Ben
dc.rights© 2006 World Scientific Publishing. This is the author created version of a work that has been peer reviewed and accepted for publication by Modern Physics Letters B, World Scientific Publishing. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: http://dx.doi.org/10.1142/S0217984906011736.en
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonicsen
dc.titleSoft X-Ray absorption spectroscopy of the MgB2 boron K edge in an MgB2/Mg compositeen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Materials Science & Engineeringen
dc.identifier.doi10.1142/S0217984906011736en
dc.description.versionAccepted versionen
item.fulltextWith Fulltext-
item.grantfulltextopen-
Appears in Collections:MSE Journal Articles
Files in This Item:
File Description SizeFormat 
12. SOFT X-RAY ABSORPTION SPECTROSCOPY.pdf814.84 kBAdobe PDFThumbnail
View/Open

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.