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|Title:||Soft X-Ray absorption spectroscopy of the MgB2 boron K edge in an MgB2/Mg composite||Authors:||Li, Qiang
Fischer, D. A.
Moodenbaugh, A. R.
Gu, G. D.
Welch, David O.
Davenport, James W.
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics||Issue Date:||2006||Source:||Fischer, D. A., Moodenbaugh, A. R., Li, Q., Gu, G. D., Zhu, Y., Davenport, J. W., et al. (2006). Soft X-Ray absorption spectroscopy of the MgB2 boron K edge in an MgB2/Mg composite. Modern Physics Letters B, 20(19), 1207-1216.||Series/Report no.:||Modern physics letters B||Abstract:||Soft X-ray absorption spectroscopy (XAS), using uorescence yield, was used to study the boron K near edge in MgB2 superconductor. The sample consists of MgB2 crystallites randomly oriented in a magnesium matrix. Abrasion of the sample surface in vacuum provides a surface relatively free of boron-containing impurities. The intrinsic boron K near edge spectrum of the sample at a temperature of 295 K is identified. This spectrum is then compared in detail with a spectrum calculated using the full potential linearized augmented plane wave method. Features predicted by the theory appear near the expected energies, with qualitative agreement regarding shape and intensity.||URI:||https://hdl.handle.net/10356/92669
|DOI:||10.1142/S0217984906011736||Rights:||© 2006 World Scientific Publishing. This is the author created version of a work that has been peer reviewed and accepted for publication by Modern Physics Letters B, World Scientific Publishing. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: http://dx.doi.org/10.1142/S0217984906011736.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||MSE Journal Articles|
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