Please use this identifier to cite or link to this item:
|Title:||Silicon odometer : an on-chip reliability monitor for measuring frequency degradation of digital circuits||Authors:||Kim, Tony Tae-Hyoung
Kim, Chris H.
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits||Issue Date:||2008||Source:||Kim, T. H., Persaud, R., & Kim, C. H. (2008). Silicon odometer: an on-chip reliability monitor for measuring frequency degradation of digital circuits. IEEE Journal of Solid State Circuits. 43(4), 874-880.||Series/Report no.:||IEEE journal of solid state circuits||Abstract:||Precise measurement of digital circuit degradation is a key aspect of aging tolerant digital circuit design. In this study, we present a fully digital on-chip reliability monitor for high-resolution frequency degradation measurements of digital circuits. The proposed technique measures the beat frequency of two ring oscillators, one stressed and the other unstressed, to achieve 50 X higher delay sensing resolution than that of prior techniques. The differential frequency measurement technique also eliminates the effect of common-mode environmental variation such as temperature drifts between each sampling points. A 265 X 132 mum square test chip implementing this design has been fabricated in a 1.2 V, 130 nm CMOS technology. The measured resolution of the proposed monitoring circuit was 0.02%, as the ring oscillator in this design has a period of 4 ns; this translates to a temporal resolution of 0.8 ps. The 2 mus measurement time was sufficiently short to suppress the unwanted recovery effect from concealing the actual circuit degradation.||URI:||https://hdl.handle.net/10356/93518
|ISSN:||0018-9200||DOI:||10.1109/JSSC.2008.917502||Rights:||© 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
Files in This Item:
|Silicon Odometer- An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits.pdf||1.46 MB||Adobe PDF|
checked on Sep 3, 2020
WEB OF SCIENCETM
checked on Sep 25, 2020
Page view(s) 50768
checked on Oct 1, 2020
checked on Oct 1, 2020
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.