Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/93518
Full metadata record
DC FieldValueLanguage
dc.contributor.authorKim, Tony Tae-Hyoungen
dc.contributor.authorPersaud, Randy.en
dc.contributor.authorKim, Chris H.en
dc.date.accessioned2010-08-20T01:53:30Zen
dc.date.accessioned2019-12-06T18:40:44Z-
dc.date.available2010-08-20T01:53:30Zen
dc.date.available2019-12-06T18:40:44Z-
dc.date.copyright2008en
dc.date.issued2008en
dc.identifier.citationKim, T. H., Persaud, R., & Kim, C. H. (2008). Silicon odometer: an on-chip reliability monitor for measuring frequency degradation of digital circuits. IEEE Journal of Solid State Circuits. 43(4), 874-880.en
dc.identifier.issn0018-9200en
dc.identifier.urihttps://hdl.handle.net/10356/93518-
dc.description.abstractPrecise measurement of digital circuit degradation is a key aspect of aging tolerant digital circuit design. In this study, we present a fully digital on-chip reliability monitor for high-resolution frequency degradation measurements of digital circuits. The proposed technique measures the beat frequency of two ring oscillators, one stressed and the other unstressed, to achieve 50 X higher delay sensing resolution than that of prior techniques. The differential frequency measurement technique also eliminates the effect of common-mode environmental variation such as temperature drifts between each sampling points. A 265 X 132 mum square test chip implementing this design has been fabricated in a 1.2 V, 130 nm CMOS technology. The measured resolution of the proposed monitoring circuit was 0.02%, as the ring oscillator in this design has a period of 4 ns; this translates to a temporal resolution of 0.8 ps. The 2 mus measurement time was sufficiently short to suppress the unwanted recovery effect from concealing the actual circuit degradation.en
dc.format.extent7 p.en
dc.language.isoenen
dc.relation.ispartofseriesIEEE journal of solid state circuitsen
dc.rights© 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Electronic circuitsen
dc.titleSilicon odometer : an on-chip reliability monitor for measuring frequency degradation of digital circuitsen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.identifier.doi10.1109/JSSC.2008.917502en
dc.description.versionPublished versionen
item.fulltextWith Fulltext-
item.grantfulltextopen-
Appears in Collections:EEE Journal Articles

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.