Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/93818
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dc.contributor.authorSingh, Vijay Rajen
dc.contributor.authorAnand, Asundien
dc.date.accessioned2011-03-08T08:27:29Zen
dc.date.accessioned2019-12-06T18:46:03Z-
dc.date.available2011-03-08T08:27:29Zen
dc.date.available2019-12-06T18:46:03Z-
dc.date.copyright2009en
dc.date.issued2009en
dc.identifier.citationSingh, V. R., & Anand, A. (2009). In-line digital holography for dynamic metrology of MEMS. Chinese Optics Letters, 7(12), 1117-1122.en
dc.identifier.issn1671-7694en
dc.identifier.urihttps://hdl.handle.net/10356/93818-
dc.identifier.urihttp://hdl.handle.net/10220/6758en
dc.description.abstractIn-line digital holography helps to relax the spatial resolution requirement on charge-coupled device sensors for digital recording of holograms and to utilize the full sensing area for image reconstruction which provides larger field of view and better imaging resolution. In this letter, a lensless in-line digital holographic microscopy is presented for dynamic metrology of micro-electro-mechanical systems devices. The methodologies of interferometry and time-averaged in-line digital holography are presented for dynamic measurements, which are also useful for simultaneous suppression of in-line waves from real image wave. The experimental results are presented for dynamic thermal characterization of microheater and vibration analysis of cantilevers.en
dc.format.extent6 p.en
dc.language.isoenen
dc.relation.ispartofseriesChinese optics lettersen
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonicsen
dc.titleIn-line digital holography for dynamic metrology of MEMSen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Mechanical and Aerospace Engineeringen
dc.identifier.doihttp://dx.doi.org/10.3788/COL20090712.1117en
dc.description.versionPublished versionen
dc.identifier.rims143338en
item.grantfulltextopen-
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