Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/93970
Title: X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials
Authors: Dong, Zhili
Issue Date: 2009
Source: Dong, Z. L. (2009). X-ray diffraction, Rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials. Handbook of Nanoceramics and Their Based Nanodevices (pp. 303-336). USA: American Scientific Publishers.
Series/Report no.: Handbook of nanoceramics and their based nanodevices
Abstract: Abstract not available.
URI: https://hdl.handle.net/10356/93970
http://hdl.handle.net/10220/9215
Rights: © 2009 American Scientific Publishers.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:MSE Journal Articles

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