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|Title:||X-ray diffraction, rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials||Authors:||Dong, Zhili||Issue Date:||2009||Source:||Dong, Z. L. (2009). X-ray diffraction, Rietveld crystal structure refinement and high-resolution transmission electron microscopy of nano-structured materials. Handbook of Nanoceramics and Their Based Nanodevices (pp. 303-336). USA: American Scientific Publishers.||Series/Report no.:||Handbook of nanoceramics and their based nanodevices||Abstract:||Abstract not available.||URI:||https://hdl.handle.net/10356/93970
|Rights:||© 2009 American Scientific Publishers.||Fulltext Permission:||none||Fulltext Availability:||No Fulltext|
|Appears in Collections:||MSE Journal Articles|
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