Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/94290
Title: | Reliability assessment of restructured power systems using reliability network equivalent and pseudo-sequential simulation techniques | Authors: | Ding, Yi Wang, Peng Goel, Lalit Billinton, Roy Karki, Rajesh |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Electric power::Production, transmission and distribution | Issue Date: | 2007 | Source: | Ding, Y., Wang, P., Goel, L., Billinton, R., & Karki, R. (2007). Reliability assessment of restructured powersystems using reliability network equivalent and pseudo-sequential simulation techniques. Electric Power Systems Research, 77(12), 1665-1671. | Series/Report no.: | Electric power systems research | Abstract: | This paper presents a technique to evaluate reliability of a restructured power system with a bilateral market. The proposed technique is based on the combination of the reliability network equivalent and pseudo-sequential simulation approaches. The reliability network equivalent techniques have been implemented in the Monte Carlo simulation procedure to reduce the computational burden of the analysis. Pseudo-sequential simulation has been used to increase the computational efficiency of the non-sequential simulation method and to model the chronological aspects of market trading and system operation. Multi-state Markov models for generation and transmission systems are proposed and implemented in the simulation. A new load shedding scheme is proposed during generation inadequacy and network congestion to minimize the load curtailment. The IEEE reliability test system (RTS) is used to illustrate the technique. | URI: | https://hdl.handle.net/10356/94290 http://hdl.handle.net/10220/7183 |
ISSN: | 0378-7796 | DOI: | 10.1016/j.epsr.2006.11.010 | Schools: | School of Electrical and Electronic Engineering | Rights: | Copyrights Elsevier. The Journal's web site is located at http://www.elsevier.com/locate/epsr | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
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