Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/94372
Title: Properties of (K,Na)NbO3-based lead-free piezoelectric films prepared by pulsed laser deposition
Authors: Chua, Ngeah Theng
You, Lu
Ma, Jan
Wang, Junling
Keywords: DRNTU::Engineering::Materials
Issue Date: 2010
Source: Chua, N. T., You, L., Ma, J. & Wang, J. (2010). Properties of (K,Na)NbO3-based lead-free piezoelectric films prepared by pulsed laser deposition. Thin Solid Films, 518(23), 6777-6780.
Series/Report no.: Thin solid films
Abstract: To investigate the properties of (K,Na)NbO3-based lead-free piezoelectric films at the morphotropic phase boundary composition, we fabricated epitaxial [(K0.5Na0.5)0.97Li 0.03] (Nb0.8Ta0.2)O3 films on (001), (110) and (111)-oriented single crystal SrTiO3 substrates by pulsed laser deposition. The structure and electrical properties of the films were studied. Dielectric constants of 540, 390 and 300 and remnant polarizations of 4.00, 1.05, and 0.35 μC/cm2 were observed for the (001), (110) and (111) oriented films, respectively.
URI: https://hdl.handle.net/10356/94372
http://hdl.handle.net/10220/7514
DOI: 10.1016/j.tsf.2010.06.016
Rights: © 2010 Elsevier  This is the author created version of a work that has been peer reviewed and accepted for publication by Thin Solid Films, Elsevier.  It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document.  The published version is available at: http://dx.doi.org/10.1016/j.tsf.2010.06.016 .
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MSE Journal Articles

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