Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/94379
Title: Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials
Authors: Schenk, John O.
Fiddy, Michael A.
Zhang, Yuan
Chuang, Yi-Chen
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2011
Source: Zhang, Y., Chuang, Y. C., Schenk, J. O., & Fiddy, M. A. (2011). Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials. Applied Physics A: Materials Science & Processing, 107(1), 61-69.
Series/Report no.: Applied physics A: materials science & processing
Abstract: A metamaterial slab, used as a superlens in a subwavelength imaging system, is frequently assumed homogeneous. It is the bulk properties of the metamaterial which are responsible for the resolution of the transferred information in the image domain, as a result of high transverse wave-vector coupling. However, how in a discretized metamaterial, individual meta-atoms (i.e., the meta-elements composing a negative index metamaterial slab) contribute to the imaging process is still actively studied. The main aim of this paper is to investigate the consequences of using only a few meta-atoms as a negative index slab-equivalent for subwavelength scale imaging. We make a specific choice for a meta-atom and investigate its resonant scattering patterns. We report on how knowledge of these 3D scattering patterns provides a means to understand the transfer of high spatial frequencies and assist with the design an improved negative index slab.
URI: https://hdl.handle.net/10356/94379
http://hdl.handle.net/10220/7815
ISSN: 0947-8396
DOI: 10.1007/s00339-011-6738-9
Schools: School of Electrical and Electronic Engineering 
Organisations: Electromagnetics Academy at Zhejiang University, China
Centre for Optoelectronics and Optical Communications, Univ. of North Carolina at Charlotte, USA
Rights: © Springer-Verlag 2011.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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