Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/94713
Title: Solving channel assignment problems using local search methods and simulated annealing
Authors: Lee, Sally Ng Sa.
Hing, Wong Yow.
Wang, Lipo.
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2011
Source: Wang, L., Lee, S. N. S., & Hing, W. Y. (2011). Solving channel assignment problems using local search methods and simulated annealing. Proceedings of SPIE, Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering IX, 8058.
Abstract: We solve the channel assignment problems (CAPs) with the main objective of minimizing the overall interference level while meeting the channel demand requirements. We use 3 methods, i.e., (1) local search (LS) with an acceptance ratio to re-initialize the search at a predefined threshold; (2) Simulated Annealing (SA); and (3) improve local search (ILS) with two control parameters, namely Restart (RS) and Stop (ST) thresholds. Simulation results on benchmarking CAPs show that these simple methods outperform other more complex heuristics on both the average and minimum cost solutions.
URI: https://hdl.handle.net/10356/94713
http://hdl.handle.net/10220/8133
DOI: 10.1117/12.884492
Rights: © 2011 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE, Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering IX and is made available as an electronic reprint (preprint) with permission of SPIE. The paper can be found at the following official URL: [http://dx.doi.org/10.1117/12.884492].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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