Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/94809
Title: Thickness dependency of field emission in amorphous and nanostructured carbon thin films
Authors: Shakerzadeh, Maziar
Teo, Edwin Hang Tong
Tay, Beng Kang
Keywords: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Issue Date: 2012
Source: Shakerzadeh, M., Teo, E. H. T., & Tay, B. K. (2012). Thickness dependency of field emission in amorphous and nanostructured carbon thin films. Nanoscale Research Letters, 7(1), 286.
Series/Report no.: Nanoscale research letters
Abstract: Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp2 clusters, the emission does not depend on the film thickness. This further proves that the emission happens from the surface sp2 sites due to large enhancement of electric field on these sites. However, in the case of carbon films with nanocrystals of preferred orientation, the emission strongly depends on the film thickness. sp2-bonded nanocrystals have higher aspect ratio in thicker films which in turn results in higher field enhancement and hence easier electron emission.
URI: https://hdl.handle.net/10356/94809
http://hdl.handle.net/10220/9318
ISSN: 1556-276X
DOI: 10.1186/1556-276X-7-286
Rights: © 2012 The Author(s).
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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