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|Title:||Epidemic reemergence in adaptive complex networks||Authors:||Wong, L.
Cheong, Siew Ann
Cheng, Tee Hiang
|Keywords:||DRNTU::Science||Issue Date:||2012||Source:||Zhou, J., Xiao, G., Cheong, S. A., Fu, X., Wong, L., Ma, S., et al. (2012). Epidemic reemergence in adaptive complex networks. Physical review E, 85(3), 036107.||Series/Report no.:||Physical review E||Abstract:||The dynamic nature of a system gives rise to dynamical features of epidemic spreading, such as oscillation and bistability. In this paper, by studying the epidemic spreading in growing networks, in which susceptible nodes may adaptively break the connections with infected ones yet avoid being isolated, we reveal a phenomenon, epidemic reemergence, where the number of infected nodes is incubated at a low level for a long time and then erupts for a short time. The process may repeat several times before the infection finally vanishes. Simulation results show that all three factors, namely the network growth, the connection breaking, and the isolation avoidance, are necessary for epidemic reemergence to happen. We present a simple theoretical analysis to explain the process of reemergence in detail. Our study may offer some useful insights, helping explain the phenomenon of repeated epidemic explosions.||URI:||https://hdl.handle.net/10356/95339
|DOI:||10.1103/PhysRevE.85.036107||Rights:||© 2012 American Physical Society. This paper was published in Physical Review E and is made available as an electronic reprint (preprint) with permission of American Physical Society. The paper can be found at the following official DOI: [http://dx.doi.org/10.1103/PhysRevE.85.036107]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
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