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Title: | Probing carboxylic acid groups in replaced and mixed self-assembled monolayers by individual ionized dendrimer molecules : an atomic force microscopy study | Authors: | Wiesler, U. M. Grim, P. C. M. Vosch, T. Berresheim, A. J. Müllen, K. Van Haesendonck, C. Vandamme, N. De Schryver, F. C. Zhang, Hua Liu, Daojun De Feyter, Steven |
Keywords: | DRNTU::Engineering::Materials | Issue Date: | 2002 | Source: | Zhang, H., Grim, P. C. M., Liu, D., Vosch, T., De Feyter, S., Wiesler, U. M., et al. (2002). Probing carboxylic acid groups in replaced and mixed self-assembled monolayers by individual ionized dendrimer molecules : an atomic force microscopy study. Langmuir, 18(5), 1801-1810. | Series/Report no.: | Langmuir | Abstract: | Polyphenylene dendrimer molecules, G2Td(COOH)16, were ionized (G2 ions) and then adsorbed on a carboxylic acid (COOH) group terminated self-assembled monolayer (SAM) on a Au substrate through the linkage with Cu2+ ions. The individual G2 ions were observed by noncontact atomic force microscopy (NCAFM). The strong interaction between the G2 and Cu2+ ions, the latter of which are preadsorbed on the COOH SAM, led to a compression or deformation of the SAM and resulted in a decreased height of the G2 ions measured by NCAFM as compared to a theoretical model of the dendrimer molecules. The present method offers an approach to bind dendrimer molecules to a solid substrate and to study the nanoscale behavior of two kinds of thiol molecules in replaced and mixed SAMs. | URI: | https://hdl.handle.net/10356/95392 http://hdl.handle.net/10220/8549 |
ISSN: | 0743-7463 | DOI: | 10.1021/la011061t | Rights: | © 2002 American Chemical Society. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | MSE Journal Articles |
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