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Title: | Ultrafast laser-induced electron emission from multiphoton to optical tunneling | Authors: | Pant, M. Ang, Ricky Lay Kee |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics | Issue Date: | 2012 | Source: | Pant, M., & Ang, L. K. R. (2012). Ultrafast laser-induced electron emission from multiphoton to optical tunneling. Physical review B, 86(4), 045423-. | Series/Report no.: | Physical review B | Abstract: | Based on a time-dependent quantum model, a relation between the onset of the optical tunneling regime and the metal work function is determined. In the multiphoton regime, the number of photons required for absorption is reduced from n=3 (at pulse length τ>20 fs) to n=2 (at τ<8 fs) due to the energy uncertainty principle. The phase of the laser is important for optical tunneling, but is only manifest in the multiphoton regime when the number of laser cycles is close to or less than 1. The effect of the field gradient at the tip can be important when the radius of the tip is 40 nm or smaller. The extension of the model to include nonequilibrium electron distribution due to ultrafast laser excitation is discussed. Comparisons with other models and experimental findings are presented. | URI: | https://hdl.handle.net/10356/95464 http://hdl.handle.net/10220/9126 |
DOI: | 10.1103/PhysRevB.86.045423 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2012 American Physical Society. This paper was published in Physical Review B and is made available as an electronic reprint (preprint) with permission of American Physical Society. The paper can be found at the following official DOI: [http://dx.doi.org/10.1103/PhysRevB.86.045423]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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