Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/95482
Title: Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study
Authors: Grim, P. C. M.
Vosch, T.
Wiesler, U. M.
Berresheim, A. J.
Müllen, K.
De Schryver, F. C.
Zhang, Hua
Keywords: DRNTU::Engineering::Materials
Issue Date: 2000
Source: Zhang, H., Grim, P. C. M., Vosch, T., Wiesler, U. M., Berresheim, A. J., Müllen, K., & De Schryver, F. C. (2000). Discrimination of dendrimer aggregates on mica based on adhesion force : a pulsed force mode atomic force microscopy study. Langmuir, 16(24), 9294-9298.
Series/Report no.: Langmuir
Abstract: Two different types of aggregated polyphenylene dendrimer molecules, G2Td(COOH)16 and G4-Td, obtained by spin coating a dilute solution onto freshly cleaved mica surfaces, and their adhesion properties were measured by pulsed force mode (PFM) AFM. The adhesion properties could be related to the chemical nature of the outer surface of the dendrimers and the mica surface, and the thin film of water adsorbed on mica when imaged under ambient conditions. Most importantly, from the adhesion image of mixed aggregates of G2Td(COOH)16 and G4-Td, as measured by PFM-AFM, the two different aggregated dendrimers can be easily discriminated.
URI: https://hdl.handle.net/10356/95482
http://hdl.handle.net/10220/8531
ISSN: 0743-7463
DOI: 10.1021/la0008378
Rights: © 2000 American Chemical Society.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:MSE Journal Articles

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.