Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/95494
Title: Properties of single dendrimer molecules studied by atomic force microscopy
Authors: Grim, P. C. M.
Foubert, P.
Vosch, T.
Vanoppen, P.
Wiesler, U. M.
Berresheim, A. J.
Müllen, K.
De Schryver, F. C.
Zhang, Hua
Keywords: DRNTU::Engineering::Materials
Issue Date: 2000
Source: Zhang, H., Grim, P. C. M., Foubert, P., Vosch, T., Vanoppen, P., Wiesler, U. M., et al. (2000). Properties of single dendrimer molecules studied by atomic force microscopy. Langmuir, 16(23), 9009-9014.
Series/Report no.: Langmuir
Abstract: Well-separated, individual polyphenylene dendrimer molecules have been prepared by spin coating on a mica surface, and subsequently imaged by noncontact atomic force microscopy (NCAFM). The observed height is in good agreement with the size of a single dendrimer molecule, as calculated by molecular dynamics simulation. By using pulsed force mode (PFM) AFM, stiffness and adhesion properties of individual polyphenylene dendrimers have been studied. They could be related to the molecular structure and the chemical nature of the outer surface of the dendrimers and the thin film of water adsorbed on mica when imaged under ambient conditions. Finally, by changing the concentration of the spin-coating solution, two different kinds of aggregates have been characterized.
URI: https://hdl.handle.net/10356/95494
http://hdl.handle.net/10220/8631
ISSN: 0743-7463
DOI: 10.1021/la000201g
Rights: © 2000 American Chemical Society.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:MSE Journal Articles

Google ScholarTM

Check

Altmetric

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.