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|Title:||A fast non-Monte-Carlo yield analysis and optimization by stochastic orthogonal polynomials||Authors:||Tan, Sheldon X. D.
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering||Issue Date:||2010||Source:||Gong, F., Liu, X., Yu, H., Tan, S. X. D., Ren, J., & He, L. (2012). A fast non-Monte-Carlo yield analysis and optimization by stochastic orthogonal polynomials. ACM Transactions on Design Automation of Electronic Systems, 17(1).||Series/Report no.:||ACM transactions on design automation of electronic systems||Abstract:||Performance failure has become a significant threat to the reliability and robustness of analog circuits. In this article, we first develop an efficient non-Monte-Carlo (NMC) transient mismatch analysis, where transient response is represented by stochastic orthogonal polynomial (SOP) expansion under PVT variations and probabilistic distribution of transient response is solved. We further define performance yield and derive stochastic sensitivity for yield within the framework of SOP, and finally develop a gradient-based multiobjective optimization to improve yield while satisfying other performance constraints. Extensive experiments show that compared to Monte Carlo-based yield estimation, our NMC method achieves up to 700X speedup and maintains 98% accuracy. Furthermore, multiobjective optimization not only improves yield by up to 95.3% with performance constraints, it also provides better efficiency than other existing methods.||URI:||https://hdl.handle.net/10356/95526
|ISSN:||1084-4309||DOI:||10.1145/2071356.2071366||Rights:||© 2012 ACM. This is the author created version of a work that has been peer reviewed and accepted for publication by ACM Transactions on Design Automation of Electronic Systems, ACM. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1145/2071356.2071366].||Fulltext Permission:||open||Fulltext Availability:||With Fulltext|
|Appears in Collections:||EEE Journal Articles|
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