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dc.contributor.authorZhang, Huaen
dc.contributor.authorMüllen, Klausen
dc.contributor.authorDe Feyter, Stevenen
dc.identifier.citationZhang, H., Müllen, K., & De Feyter, S. (2007). Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers. Journal of Physical Chemistry C, 111(23), 8142-8144.en
dc.description.abstractPulsed-force-mode atomic force microscopy (PFM-AFM) with a chemically modified tip was employed to measure the topography and adhesion force images of homoaggregates of fourth generation polyphenylene and carboxylic-acid-functionalized second generation polyphenylene dendrimers on hydrophilic self-assembled monolayers (SAMs). Although from the AFM topographic image the dendrimers could not be discriminated, from the adhesion image, the respective homoaggregates were easily discriminated. The determination is based on the different adhesive interactions between the dendrimers and the chemically modified tip, which are related to the chemical nature of the outer-surface functional groups, and the adsorbed water layer on hydrophilic surfaces under ambient conditions. It shows that PFM-AFM with chemically modified tips has nanoscale chemical spatial resolution.en
dc.relation.ispartofseriesJournal of physical chemistry Cen
dc.rights© 2007 American Chemical Society.en
dc.titlePulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayersen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Materials Science & Engineeringen
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