Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/95586
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dc.contributor.authorZhang, Huaen
dc.contributor.authorMüllen, Klausen
dc.contributor.authorDe Feyter, Stevenen
dc.date.accessioned2012-09-24T01:07:50Zen
dc.date.accessioned2019-12-06T19:17:54Z-
dc.date.available2012-09-24T01:07:50Zen
dc.date.available2019-12-06T19:17:54Z-
dc.date.copyright2007en
dc.date.issued2007en
dc.identifier.citationZhang, H., Müllen, K., & De Feyter, S. (2007). Pulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayers. Journal of Physical Chemistry C, 111(23), 8142-8144.en
dc.identifier.issn1932-7447en
dc.identifier.urihttps://hdl.handle.net/10356/95586-
dc.identifier.urihttp://hdl.handle.net/10220/8605en
dc.description.abstractPulsed-force-mode atomic force microscopy (PFM-AFM) with a chemically modified tip was employed to measure the topography and adhesion force images of homoaggregates of fourth generation polyphenylene and carboxylic-acid-functionalized second generation polyphenylene dendrimers on hydrophilic self-assembled monolayers (SAMs). Although from the AFM topographic image the dendrimers could not be discriminated, from the adhesion image, the respective homoaggregates were easily discriminated. The determination is based on the different adhesive interactions between the dendrimers and the chemically modified tip, which are related to the chemical nature of the outer-surface functional groups, and the adsorbed water layer on hydrophilic surfaces under ambient conditions. It shows that PFM-AFM with chemically modified tips has nanoscale chemical spatial resolution.en
dc.language.isoenen
dc.relation.ispartofseriesJournal of physical chemistry Cen
dc.rights© 2007 American Chemical Society.en
dc.subjectDRNTU::Engineering::Materialsen
dc.titlePulsed-force-mode AFM studies of polyphenylene dendrimers on self-assembled monolayersen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Materials Science and Engineeringen
dc.identifier.doihttp://dx.doi.org/10.1021/jp073388uen
item.grantfulltextnone-
item.fulltextNo Fulltext-
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