Please use this identifier to cite or link to this item:
Title: Layer-by-layer oxidation of InN(0001) thin films into body-center cubic In2O3(111) by cycle rapid thermal annealing
Authors: Liu, H. F.
Chi, Dong Zhi
Liu, Wei
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2012
Source: Liu, H. F., Chi, D. Z., & Liu, W. (2012). Layer-by-layer oxidation of InN(0001) thin films into body-center cubic In2O3(111) by cycle rapid thermal annealing. CrystEngComm, 14(21), 7140-7144.
Series/Report no.: CrystEngComm
Abstract: We report on a study of In2O3 thin films obtained by post-growth thermal oxidation of InN(0001) using rapid thermal annealing (RTA) and cycle-RTA (CRTA). The crystal qualities of both the resultant In2O3 and the remaining InN were significantly improved by using CRTA instead of RTA. Body-center cubic (bcc) In2O3, consisting of two In2O3(111) variants in-plane rotated 60° with respect to each other, was epitaxially grown on InN(0001). The in-plane orientations were determined as In2O3[01[1 with combining macron]]//InN[11[2 with combining macron]0] and In2O3[01[1 with combining macron]]//InN[[1 with combining macron]2[1 with combining macron]0] for the two In2O3(111) variants. Microscopic and spectroscopic analyses, together with the effect of Si3N4 encapsulations, provide evidence that the oxidation of InN is realized by oxygen inward diffusion. The oxygen inward diffusion is slowed down and the thermal decomposition of InN is suppressed by using CRTA, which in turn leads to a layer-by-layer oxidation of InN.
ISSN: 1466-8033
DOI: 10.1039/c2ce25858g
Rights: © 2012 The Royal Society of Chemistry.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

Citations 20

Updated on Sep 1, 2020

Citations 20

Updated on Mar 5, 2021

Page view(s) 20

Updated on Nov 28, 2021

Google ScholarTM




Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.