Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/95861
Full metadata record
DC FieldValueLanguage
dc.contributor.authorShalabney, Atefen
dc.contributor.authorKhare, Chinmayen
dc.contributor.authorRauschenbach, Bernden
dc.contributor.authorAbdulhalim, Ibrahimen
dc.date.accessioned2013-07-23T01:47:17Zen
dc.date.accessioned2019-12-06T19:22:25Z-
dc.date.available2013-07-23T01:47:17Zen
dc.date.available2019-12-06T19:22:25Z-
dc.date.copyright2012en
dc.date.issued2012en
dc.identifier.citationShalabney, A., Khare, C., Rauschenbach, B., & Abdulhalim, I. (2012). Metallic nanosculptured thin films for biosensing applications using surface Plasmon resonance and enhanced spectroscopies. 2012 IEEE 27th Convention of Electrical & Electronics Engineers in Israel (IEEEI).en
dc.identifier.urihttps://hdl.handle.net/10356/95861-
dc.identifier.urihttp://hdl.handle.net/10220/11997en
dc.description.abstractMetallic nanosculptured thin films are made of nanorods in different shapes prepared by means of the oblique angle deposition technique. Assessment of these films for biosensing and molecular detection has been investigated by our group recently using surface Plasmon resonance (SPR), surface enhanced fluorescence (SEF), and surface enhanced Raman scattering (SERS). Using columnar thin film (CTF) as the transducer layer in SPR sensors enhances both the angular and spectral sensitivity of the sensor. Sculptured thin films (STFs) made of different materials, shapes, sizes, orientations, porosities, and deposited on different substrates were examined as SEF and SERS detection platforms. The optimal features of STFs were examined to obtain the highest enhancement of SERS and SEF. The potential of these films for biosensing and bimolecular detection was demonstrated. Stability of the films was noticed over a period of one year without significant degradation.en
dc.language.isoenen
dc.rights© 2012 IEEE.en
dc.titleMetallic nanosculptured thin films for biosensing applications using surface Plasmon resonance and enhanced spectroscopiesen
dc.typeConference Paperen
dc.contributor.schoolSchool of Materials Science and Engineeringen
dc.contributor.conferenceConvention of Electrical & Electronics Engineers in Israel (27th : 2012 : Eilat, Israel)en
dc.identifier.doihttp://dx.doi.org/10.1109/EEEI.2012.6377040en
item.grantfulltextnone-
item.fulltextNo Fulltext-
Appears in Collections:MSE Conference Papers

Google ScholarTM

Check

Altmetric

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.