Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/95957
Title: | Fast-transient integrated digital DC-DC converter with predictive and feedforward control | Authors: | Foong, Huey Chian Zheng, Yuanjin Tan, Yen Kheng Tan, Meng Tong |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering | Issue Date: | 2012 | Source: | Foong, H. C., Zheng, Y., Tan, Y. K., & Tan, M. T. (2012). Fast-Transient Integrated Digital DC-DC Converter With Predictive and Feedforward Control. IEEE Transactions on Circuits and Systems I: Regular Papers, 59(7), 1567-1576. | Series/Report no.: | IEEE transactions on circuits and systems I : regular papers | Abstract: | This paper introduces a dual-mode digital dc-dc converter combining the predictive and feedforward control with the conventional PID controller to achieve fast transient response and low overshoot. An additional predictive or jerk component is added to the conventional PID controller to speed up the transient response and reduce the settling time by approximately 50%. This predictive term is based on the second derivative of the error signal and introduces zero to the loop response which leads to increased bandwidth and improved phase margin. In addition, a feedforward control is also employed to further improve the transient by evaluating the change in the inductor current during the on and off time of the power transistors. Theoretical analysis and simulations were carried out to analyze the proposed design and algorithm. The proposed design is verified on silicon with a prototype of a digital dc-dc converter fabricated in CMOS 0.18 μ m process. The digital dc-dc converter achieved a settling time of 4 μs and an overshoot of 15 mV for a step-load transient of 450 mA, which are improved significantly as compared to the prior arts. | URI: | https://hdl.handle.net/10356/95957 http://hdl.handle.net/10220/11319 |
ISSN: | 1549-8328 | DOI: | 10.1109/TCSI.2011.2177012 | Rights: | © 2012 IEEE. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
Appears in Collections: | EEE Journal Articles |
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