Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96010
Title: Fractal complementary bowtie aperture for confining and enhancing optical magnetic field
Authors: Yang, Y.
Dai, Haitao
Sun, Xiaowei
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Issue Date: 2012
Source: Yang, Y., Dai, H., & Sun, X. W. (2012). Fractal complementary bowtie aperture for confining and enhancing optical magnetic field. Proceedings of SPIE-Photonic and Phononic Properties of Engineered Nanostructures II, 8269.
Conference: Photonic and Phononic Properties of Engineered Nanostructures (2nd : 2012 : San Francisco, USA)
Abstract: A new kind of bowtie related structures, Sierpinski complementary bowtie aperture (SCBA), is proposed for enhancing and confining optical magnetic field. The magnetic field enhancement factor can be improved with the presence of the fractal. Numerical simulation shows that higher iteration of the SCBA is responsible for the variation of the resonant wavelengths. The magnetic field distributions illustrated 10nm above the output plane prove the magnetic intensity is confined in the sub-wavelength scale. Further investigation demonstrates current can be enhanced in the center of the apertures while electric fields are found to be easier to concentrate at the tiny fractal structures. Magnetic intensity distributions at several resonant points in the spectrum of the third-iteration SCBA are also plotted and the longer wavelength region in near infrared is found to be unsuited for confining magnetic field in SCBA due to weak interaction with the fractals.
URI: https://hdl.handle.net/10356/96010
http://hdl.handle.net/10220/10066
DOI: 10.1117/12.907362
Schools: School of Electrical and Electronic Engineering 
Rights: © 2012 Society of Photo-Optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE-Photonic and Phononic Properties of Engineered Nanostructures II and is made available as an electronic reprint (preprint) with permission of Society of Photo-Optical Instrumentation Engineers (SPIE). The paper can be found at the following official DOI: [article DOI]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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