Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96089
Title: Large-scale quantification of CVD graphene surface coverage
Authors: Ambrosi, Adriano
Bonanni, Alessandra
Sofer, Zdeněk
Pumera, Martin
Keywords: DRNTU::Engineering::Materials::Nanostructured materials
Issue Date: 2013
Source: Ambrosi, A., Bonanni, A., Sofer, Z., & Pumera, M. (2013). Large-scale quantification of CVD graphene surface coverage. Nanoscale, 5(6), 2379-2387.
Series/Report no.: Nanoscale
Abstract: The extraordinary properties demonstrated for graphene and graphene-related materials can be fully exploited when a large-scale fabrication procedure is made available. Chemical vapor deposition (CVD) of graphene on Cu and Ni substrates is one of the most promising procedures to synthesize large-area and good quality graphene films. Parallel to the fabrication process, a large-scale quality monitoring technique is equally crucial. We demonstrate here a rapid and simple methodology that is able to probe the effectiveness of the growth process over a large substrate area for both Ni and Cu substrates. This method is based on inherent electrochemical signals generated by the underlying metal catalysts when fractures or discontinuities of the graphene film are present. The method can be applied immediately after the CVD growth process without the need for any graphene transfer step and represents a powerful quality monitoring technique for the assessment of large-scale fabrication of graphene by the CVD process.
URI: https://hdl.handle.net/10356/96089
http://hdl.handle.net/10220/10047
DOI: 10.1039/c3nr33824j
Rights: © 2013 The Royal Society of Chemistry This is the author created version of a work that has been peer reviewed and accepted for publication by Nanoscale, The Royal Society of Chemistry. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1039/c3nr33824j].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:SPMS Journal Articles

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