Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96197
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dc.contributor.authorSofer, Zdeněken
dc.contributor.authorŠimek, Petren
dc.contributor.authorJankovský, Ondřejen
dc.contributor.authorSedmidubský, Daviden
dc.contributor.authorBeran, Přemyslen
dc.contributor.authorPumera, Martinen
dc.date.accessioned2015-08-19T08:54:47Zen
dc.date.accessioned2019-12-06T19:26:56Z-
dc.date.available2015-08-19T08:54:47Zen
dc.date.available2019-12-06T19:26:56Z-
dc.date.copyright2014en
dc.date.issued2014en
dc.identifier.citationSofer, Z., Šimek, P., Jankovský, O., Sedmidubský, D., Beran, P., & Pumera, M. (2014). Neutron diffraction as a precise and reliable method for obtaining structural properties of bulk quantities of graphene. Nanoscale, 6(21), 13082-13089.en
dc.identifier.issn2040-3364en
dc.identifier.urihttps://hdl.handle.net/10356/96197-
dc.description.abstractGraphene based carbon materials have attracted a great deal of attention in the last decade; nowadays tons of graphene are produced yearly. However, there is lack of precise and reliable techniques for the determination of structural properties of graphene on the bulk scale. The analytical methods being routinely applied for graphene characterization, including TEM and AFM, can be only used for the study of scant amounts of graphene samples and do not give general information on the average number of layers and the structure of the prepared graphenes. On the other hand, diffraction methods can be advantageously used to obtain information on the average thickness of the produced graphene as well as on the average sheets lateral dimensions, without the necessity of sample dispersion in solvents. We present a study of the structural properties of graphene prepared by chemical and thermal reduction of graphite oxide, comparing SEM, STEM, AFM, Raman spectroscopy, BET, X-ray and neutron diffraction methods. Our study brings new deep insights into the basic structural properties of graphene in a bulk form. Given the importance of a suitable characterization technique on the bulk materials, we wish to highlight the importance of these diffraction techniques for accurate determination of the graphene thickness and lateral parameters.en
dc.format.extent8 p.en
dc.language.isoenen
dc.relation.ispartofseriesNanoscaleen
dc.rights© 2014 The Royal Society of Chemistry. This article is licensed under a Creative Commons Attribution 3.0 Unported Licence.en
dc.subjectDRNTU::Science::Physics::Nuclear and particle physicsen
dc.titleNeutron diffraction as a precise and reliable method for obtaining structural properties of bulk quantities of grapheneen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Physical and Mathematical Sciencesen
dc.identifier.doi10.1039/C4NR04644Gen
dc.description.versionPublished versionen
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item.grantfulltextopen-
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