Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96275
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dc.contributor.authorChiah, Siau Benen
dc.contributor.authorZhou, Xingen
dc.contributor.authorChen, Zuhuien
dc.contributor.authorChen, Hung Mingen
dc.date.accessioned2013-06-25T06:04:36Zen
dc.date.accessioned2019-12-06T19:28:04Z-
dc.date.available2013-06-25T06:04:36Zen
dc.date.available2019-12-06T19:28:04Z-
dc.date.copyright2012en
dc.date.issued2012en
dc.identifier.citationChiah, S. B., Zhou, X., Chen, Z., & Chen, H. M. (2012). Unified Regional Approach to High Temperature SOI DC/AC Modeling. Microtech conference & Expo 2012, Santa Clara, CA.en
dc.identifier.urihttps://hdl.handle.net/10356/96275-
dc.identifier.urihttp://hdl.handle.net/10220/10624en
dc.description.abstractThis paper extends the recent model development [1] to include temperature effect in a range from room temperature to 300C. The extraction of the temperature coefficients used in the model and the prediction of the model accuracy to the measurement data are included in this paper. It has been indentified by Shucair [3], Prijic et al. [4] and further commented by Eman et al. [2] that a Zero-Temperature-Coefficient (ZTC) point of a MOSFET in the linear operating region is a value of Vg that the reduction of threshold voltage due to the higher operating temperature is counter-balanced by the reduction of the mobility. The reduction of threshold voltage at increasing temperature with missing mobility reduction effect is indicated. Together with our temperature-dependent mobility formulation with two temperature coefficients, which are extracted from three linear region IdsVgs measurement data at nominal, mid and high temperatures, a ZTC point in a range of temperature can be shown. The model prediction to the DC measurement and AC MEDICI data are shown.en
dc.language.isoenen
dc.rights© 2012 Microtech conference & Expo.en
dc.titleUnified regional approach to high temperature SOI DC/AC modelingen
dc.typeConference Paperen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.contributor.conferenceMicrotech Conference & Expo (2012 : Santa Clara, CA)en
dc.identifier.openurlhttp://www.techconnectworld.com/Nanotech2012/a.html?i=949en
dc.identifier.rims164835en
item.fulltextNo Fulltext-
item.grantfulltextnone-
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