Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96292
Title: Sign-extension avoidance and word-length optimization by positive-offset representation for FIR filter design
Authors: Huang, Ruimin
Chang, Chip-Hong
Faust, Mathias
Lotze, Niklas
Manoli, Yiannos
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Issue Date: 2011
Source: Huang, R., Chang, C.-H., Faust, M., Lotze, N., & Manoli, Y. (2011). Sign-extension avoidance and word-length optimization by positive-offset representation for FIR filter design. IEEE transactions on circuits and systems II : express briefs, 58(12), 916-920.
Series/Report no.: IEEE transactions on circuits and systems II : express briefs
Abstract: This brief proposes a new approach to utilizing positive-offset representation for sign-extension avoidance in shift-and-add implementation of a finite-impulse response filter. Affine arithmetic is used to model the excess offsets in order to curtail the word-length (WL) expansion problem. Tighter probabilistically justified WL bounds are determined to enable further offset to be removed from each tap. The approach is applicable even after the redundant adders in the multiplier block of the filter have been minimized. Our simulation results show an average power reduction of about 19% over and above the savings achieved by sharing of adders in multiple constant multiplication.
URI: https://hdl.handle.net/10356/96292
http://hdl.handle.net/10220/25594
ISSN: 1549-7747
DOI: 10.1109/TCSII.2011.2168130
Schools: School of Electrical and Electronic Engineering 
Rights: © 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/TCSII.2011.2168130].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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