Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96330
Title: Temperature controlled c axis elongated low symmetry phase BiFeO3 thin film on STO substrate
Authors: Ren, Peng
Cho, Soon Khuen
Liu, Peng
You, Lu
Zou, Xi
Wang, Baomin
Wang, Junling
Wang, Lan
Issue Date: 2013
Source: Ren, P., Cho, S. K., Liu, P., You, L., Zou, X., Wang, B., et al. (2013). Temperature controlled c axis elongated low symmetry phase BiFeO3 thin film on STO substrate. AIP Advances, 3(1).
Series/Report no.: AIP advances
Abstract: BiFeO3 thin films with a mixture of tunable R-like and c axis elongated low symmetry phase (T-like phase) are fabricated on STO (001) substrate through controlling of the substrate temperature. Almost pure T-like phase can be grown on STO substrate at 600°C. Comparing with the situations on LAO (001), it is found that, strains from the LAO substrate may be the only reason that induces the T-like phase at higher temperatures. At lower temperatures, the island growth induced strains alone can also generate T-like phase on STO substrate.
URI: https://hdl.handle.net/10356/96330
http://hdl.handle.net/10220/10224
ISSN: 2158-3226
DOI: 10.1063/1.4789399
Rights: © 2013 The Author(s). This paper was published in AIP Advances and is made available as an electronic reprint (preprint) with permission of The Author(s). The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.4789399].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MSE Journal Articles
SPMS Journal Articles

Files in This Item:
File Description SizeFormat 
2. Temperature controlled c axis elongated low symmetry phase BiFeO3 thin.pdf1.31 MBAdobe PDFThumbnail
View/Open

Google ScholarTM

Check

Altmetric

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.