Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/96473
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dc.contributor.authorMirsaidov, Utkuren
dc.contributor.authorOhl, Claus-Dieteren
dc.contributor.authorMatsudaira, Paulen
dc.date.accessioned2013-06-14T01:40:12Zen
dc.date.accessioned2019-12-06T19:31:13Z-
dc.date.available2013-06-14T01:40:12Zen
dc.date.available2019-12-06T19:31:13Z-
dc.date.copyright2012en
dc.date.issued2012en
dc.identifier.citationMirsaidov, U., Ohl, C.-D., & Matsudaira, P. (2012). A direct observation of nanometer-size void dynamics in an ultra-thin water film. Soft Matter, 8(27), 7108-7111.en
dc.identifier.issn1744-683Xen
dc.identifier.urihttps://hdl.handle.net/10356/96473-
dc.identifier.urihttp://hdl.handle.net/10220/10376en
dc.description.abstractHere we report the direct dynamic observation of electron beam induced nucleation of nanometer-diameter voids in a thin water film (<12 nm) on a hydrophilic substrate using an in situ TEM platform tailored towards imaging of liquids. The growth dynamics of these nano-voids in a thin water film reveal that there is a critical diameter below which voids are unstable and close up. However, the coalescence of several of such small and unstable voids allows for pathway to form larger and stable voids. A simple model based on the minimization of free energy explains our experimental observations.en
dc.language.isoenen
dc.relation.ispartofseriesSoft matteren
dc.rights© 2012 The Royal Society of Chemistry.en
dc.titleA direct observation of nanometer-size void dynamics in an ultra-thin water filmen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Physical and Mathematical Sciencesen
dc.identifier.doihttp://dx.doi.org/10.1039/c2sm25331cen
item.grantfulltextnone-
item.fulltextNo Fulltext-
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