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https://hdl.handle.net/10356/96594
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Teh, Kah Chan | en |
dc.contributor.author | Tan, Beng Soon | en |
dc.contributor.author | Li, Kwok Hung | en |
dc.date.accessioned | 2013-07-16T01:55:45Z | en |
dc.date.accessioned | 2019-12-06T19:32:52Z | - |
dc.date.available | 2013-07-16T01:55:45Z | en |
dc.date.available | 2019-12-06T19:32:52Z | - |
dc.date.copyright | 2012 | en |
dc.date.issued | 2012 | en |
dc.identifier.citation | Tan, B. S., Li, K. H., & Teh, K. C. (2012). Transmit Antenna Selection With Switch-and-Examine Combining Over Rayleigh Fading. IEEE Transactions on Vehicular Technology, 61(9), 4205-4211. | en |
dc.identifier.uri | https://hdl.handle.net/10356/96594 | - |
dc.description.abstract | In this paper, we propose a diversity combining system with transmit antenna selection at the transmitter and switch-and-examine combining (TAS/SEC) at the receiver. This system has lower processing complexity as compared with the existing TAS systems such as TAS/maximum-ratio combining (TAS/MRC) and TAS/selection combining (TAS/SC). The performance of the TAS/SEC system with different modulation schemes over an independent and nonidentically distributed (i.n.d.) Rayleigh fading channel is investigated. The expressions of the outage probability, average output signal-to-noise ratio (SNR), and symbol error rate (SER) are derived and validated by simulation results. The performance of TAS/SEC is compared with TAS/SC in terms of the SER and the average number of branches to be estimated. It is shown that, as compared with TAS/SC, the TAS/SEC system is able to achieve a lower SER with fewer branches to be estimated. | en |
dc.language.iso | en | en |
dc.relation.ispartofseries | IEEE transactions on vehicular technology | en |
dc.rights | © 2012 IEEE. | en |
dc.subject | DRNTU::Engineering::Computer science and engineering | en |
dc.title | Performance study of transmit antenna selection with switch-and-examine combining over rayleigh fading | en |
dc.type | Journal Article | en |
dc.contributor.school | School of Electrical and Electronic Engineering | en |
dc.identifier.doi | 10.1109/TVT.2012.2212924 | en |
item.fulltext | No Fulltext | - |
item.grantfulltext | none | - |
Appears in Collections: | EEE Journal Articles |
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