Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/97070
Title: Transport of intensity phase imaging by intensity spectrum fitting of exponentially spaced defocus planes
Authors: Tian, Lei
Waller, Laura
Jingshan, Zhong
Claus, Rene A.
Dauwels, Justin
Keywords: DRNTU::Engineering
Issue Date: 2014
Source: Jingshan, Z., Claus, R. A., Dauwels, J., Tian, L., & Waller, L. (2014). Transport of Intensity phase imaging by intensity spectrum fitting of exponentially spaced defocus planes. Optics Express, 22(9), 10661-10674.
Series/Report no.: Optics express
Abstract: We propose an alternative method for solving the Transport of Intensity equation (TIE) from a stack of through–focus intensity images taken by a microscope or lensless imager. Our method enables quantitative phase and amplitude imaging with improved accuracy and reduced data capture, while also being computationally efficient and robust to noise. We use prior knowledge of how intensity varies with propagation in the spatial frequency domain in order to constrain a fitting algorithm [Gaussian process (GP) regression] for estimating the axial intensity derivative. Solving the problem in the frequency domain inspires an efficient measurement scheme which captures images at exponentially spaced focal steps, significantly reducing the number of images required. Low–frequency artifacts that plague traditional TIE methods can be suppressed without an excessive number of captured images. We validate our technique experimentally by recovering the phase of human cheek cells in a brightfield microscope.
URI: https://hdl.handle.net/10356/97070
http://hdl.handle.net/10220/19575
ISSN: 1094-4087
DOI: 10.1364/OE.22.010661
Rights: © 2014 Optical Society of America. This paper was published in Optics Express and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: http://dx.doi.org/10.1364/OE.22.010661.  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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