Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/97070
Full metadata record
DC FieldValueLanguage
dc.contributor.authorTian, Leien
dc.contributor.authorWaller, Lauraen
dc.contributor.authorJingshan, Zhongen
dc.contributor.authorClaus, Rene A.en
dc.contributor.authorDauwels, Justinen
dc.date.accessioned2014-06-04T07:24:45Zen
dc.date.accessioned2019-12-06T19:38:40Z-
dc.date.available2014-06-04T07:24:45Zen
dc.date.available2019-12-06T19:38:40Z-
dc.date.copyright2014en
dc.date.issued2014en
dc.identifier.citationJingshan, Z., Claus, R. A., Dauwels, J., Tian, L., & Waller, L. (2014). Transport of Intensity phase imaging by intensity spectrum fitting of exponentially spaced defocus planes. Optics Express, 22(9), 10661-10674.en
dc.identifier.issn1094-4087en
dc.identifier.urihttps://hdl.handle.net/10356/97070-
dc.description.abstractWe propose an alternative method for solving the Transport of Intensity equation (TIE) from a stack of through–focus intensity images taken by a microscope or lensless imager. Our method enables quantitative phase and amplitude imaging with improved accuracy and reduced data capture, while also being computationally efficient and robust to noise. We use prior knowledge of how intensity varies with propagation in the spatial frequency domain in order to constrain a fitting algorithm [Gaussian process (GP) regression] for estimating the axial intensity derivative. Solving the problem in the frequency domain inspires an efficient measurement scheme which captures images at exponentially spaced focal steps, significantly reducing the number of images required. Low–frequency artifacts that plague traditional TIE methods can be suppressed without an excessive number of captured images. We validate our technique experimentally by recovering the phase of human cheek cells in a brightfield microscope.en
dc.language.isoenen
dc.relation.ispartofseriesOptics expressen
dc.rights© 2014 Optical Society of America. This paper was published in Optics Express and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: http://dx.doi.org/10.1364/OE.22.010661.  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en
dc.subjectDRNTU::Engineeringen
dc.titleTransport of intensity phase imaging by intensity spectrum fitting of exponentially spaced defocus planesen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.identifier.doi10.1364/OE.22.010661en
dc.description.versionPublished versionen
item.fulltextWith Fulltext-
item.grantfulltextopen-
Appears in Collections:EEE Journal Articles

SCOPUSTM   
Citations

106
checked on Sep 1, 2020

WEB OF SCIENCETM
Citations

90
checked on Sep 19, 2020

Page view(s)

492
checked on Sep 25, 2020

Download(s)

505
checked on Sep 25, 2020

Google ScholarTM

Check

Altmetric


Plumx

Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.