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|Title:||Development of near-field emission limit from radiated-emission limit based on statistical approach||Authors:||See, Kye Yak
Wang, Lin Biao
Koh, Wee Jin
|Keywords:||DRNTU::Engineering::Electrical and electronic engineering||Issue Date:||2012||Source:||See, K.-Y., Fang, N., Wang, L.-B., Soh, W., Svimonishvili, T., Oswal, M., et al. (2012). Development of near-field emission limit from radiated-emission limit based on statistical approach. 2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS).||Abstract:||This paper discusses a novel approach to transforming a radiated-emission limit (e.g., CISPR 22 and FCC) from the far-field to the near-field region. The proposed approach combines data from a near-field scanner and a gigahertz transverse electromagnetic cell with statistics to establish a simple relationship between a near-field magnetic field and a far-field electric field. It is shown that the proposed approach has the potential to be a simple, quick, and fairly inexpensive tool for electromagnetic compatibility pre-compliance purposes.||URI:||https://hdl.handle.net/10356/97437
|DOI:||10.1109/EDAPS.2012.6469388||Rights:||© 2012 IEEE.||Fulltext Permission:||none||Fulltext Availability:||No Fulltext|
|Appears in Collections:||EEE Conference Papers|
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