Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/97501
Title: Thickness identification of two-dimensional materials by optical imaging
Authors: Wang, Yingying
Gao, Ren Xi
Ni, Zhen Hua
He, Hui
Guo, Shu Peng
Yang, Huanping
Cong, Chunxiao
Yu, Ting
Issue Date: 2012
Source: Wang, Y. Y., Gao, R. X., Ni, Z. H., He, H., Guo, S. P., Yang, H. P., et al. (2012). Thickness identification of two-dimensional materials by optical imaging. Nanotechnology, 23(49).
Series/Report no.: Nanotechnology
Abstract: Two-dimensional materials, e.g. graphene and molybdenum disulfide (MoS2), have attracted great interest in recent years. Identification of the thickness of two-dimensional materials will improve our understanding of their thickness-dependent properties, and also help with scientific research and applications. In this paper, we propose to use optical imaging as a simple, quantitative and universal way to identify the thickness of two-dimensional materials, i.e. mechanically exfoliated graphene, nitrogen-doped chemical vapor deposition grown graphene, graphene oxide and mechanically exfoliated MoS2. The contrast value can easily be obtained by reading the red (R), green (G) and blue (B) values at each pixel of the optical images of the sample and substrate, and this value increases linearly with sample thickness, in agreement with our calculation based on the Fresnel equation. This method is fast, easily performed and no expensive equipment is needed, which will be an important factor for large-scale sample production. The identification of the thickness of two-dimensional materials will greatly help in fundamental research and future applications.
URI: https://hdl.handle.net/10356/97501
http://hdl.handle.net/10220/10678
ISSN: 0957-4484
DOI: 10.1088/0957-4484/23/49/495713
Rights: © 2012 IOP Publishing Ltd.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:SPMS Journal Articles

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