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https://hdl.handle.net/10356/97548
Title: | Third order nonlinear optical property of Bi2Se3 | Authors: | Lu, Shunbin Zhao, Chujun Zou, Yanhong Chen, Shuqing Chen, Yu Li, Ying Zhang, Han Wen, Shuangchun Tang, Dingyuan |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering | Issue Date: | 2013 | Source: | Lu, S., Zhao, C., Zou, Y., Chen, S., Chen, Y., Li, Y., et al. (2013). Third order nonlinear optical property of Bi2Se3. Optics Express, 21(2), 2072-2082. | Series/Report no.: | Optics express | Abstract: | The third order nonlinear optical property of Bi2Se3, a kind of topological insulator (TI), has been investigated under femto-second laser excitation. The open and closed aperture Z-scan measurements were used to unambiguously distinguish the real and imaginary part of the third order optical nonlinearity of the TI. When excited at 800 nm, the TI exhibits saturable absorption with a saturation intensity of 10.12 GW/cm2 and a modulation depth of 61.2%, and a giant nonlinear refractive index of 10 -14 m2/W, almost six orders of magnitude larger than that of bulk dielectrics. This finding suggests that the TI: Bi2Se 3 is indeed a promising nonlinear optical material and thus can find potential applications from passive laser mode locker to optical Kerr effect based photonic devices. | URI: | https://hdl.handle.net/10356/97548 http://hdl.handle.net/10220/11851 |
ISSN: | 1094-4087 | DOI: | 10.1364/OE.21.002072 | Rights: | © 2013 Optical Society of America. This paper was published in Optics Express and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: [http://dx.doi.org/10.1364/OE.21.002072]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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