Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/97751
Title: Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress
Authors: Lim, Meng Keong
Lin, Jingyuan
Ee, Elden Yong Chiang
Ng, Chee Mang
Wei, Jun
Gan, Chee Lip
Keywords: DRNTU::Engineering::Materials
Issue Date: 2011
Series/Report no.: Microelectronics reliability
Abstract: The electromigration behaviour of Cu/SiCOH interconnects carrying unipolar pulsed current with long periods (i.e. 2, 16, 32 and 48 h) is presented in this study. Experimental observations suggest that the electromigration behaviour during void growth can be described by the ON-time model and that the lifetime of the Cu/SiCOH interconnects is inversely related to the duty cycle. Numerical simulation is carried out to compute the time required to nucleate a void under unipolar pulsed current stress conditions. The time to void nucleation is found to vary proportionally to the inverse square of the duty cycle and is independent of frequency at 1 Hz and higher. By computing the stress evolution in interconnects with short length, it was shown that the product of the unipolar pulsed current’s duty cycle and current density, i.e. average current density, is equivalent to the current density of a constant current (D.C.) stress. The simulation results suggest (d · jL)crit as the equivalent critical current density-length product under unipolar pulsed current condition. Both the experimental and simulation results show that duty cycle has an effect on the electromigration lifetime of interconnects carrying unipolar pulsed current.
URI: https://hdl.handle.net/10356/97751
http://hdl.handle.net/10220/11237
DOI: 10.1016/j.microrel.2011.12.026
Rights: © 2011 Elsevier Ltd.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:MSE Journal Articles

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