Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/97814
Title: ICMAT 2011 : Reliability and variability of semiconductor devices and ICs
Authors: Asenov, Asen
Schlichtmann, Ulf
Tan, Cher Ming
Wong, Hei
Zhou, Xing
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2012
Series/Report no.: Microelectronics reliability
Abstract: Abstract not available in fulltext.
URI: https://hdl.handle.net/10356/97814
http://hdl.handle.net/10220/11112
DOI: 10.1016/j.microrel.2012.05.003
Rights: © 2012 Elsevier Ltd.
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Journal Articles

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