Please use this identifier to cite or link to this item:
https://hdl.handle.net/10356/97814| Title: | ICMAT 2011 : Reliability and variability of semiconductor devices and ICs | Authors: | Asenov, Asen Schlichtmann, Ulf Tan, Cher Ming Wong, Hei Zhou, Xing |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering | Issue Date: | 2012 | Series/Report no.: | Microelectronics reliability | Abstract: | Abstract not available in fulltext. | URI: | https://hdl.handle.net/10356/97814 http://hdl.handle.net/10220/11112 |
DOI: | 10.1016/j.microrel.2012.05.003 | Schools: | School of Electrical and Electronic Engineering | Rights: | © 2012 Elsevier Ltd. | Fulltext Permission: | none | Fulltext Availability: | No Fulltext |
| Appears in Collections: | EEE Journal Articles |
Items in DR-NTU are protected by copyright, with all rights reserved, unless otherwise indicated.