Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/98012
Title: Refractive index sensor using microfiber-based Mach-Zehnder interferometer
Authors: Sun, Qizhen
Liang, Ruibing
Shum, Perry Ping
Liu, Deming
Wo, Jianghai
Wang, Guanghui
Cui, Ying
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2012
Source: Wo, J., Wang, G., Cui, Y., Su, Q., Liang, R., Shum, P. P., et al. (2012). Refractive index sensor using microfiber-based Mach-Zehnder interferometer. Optics Letters, 37(1), 67-69.
Series/Report no.: Optics letters
Abstract: A simple and robust refractive index (RI) sensor based on a Mach–Zehnder interferometer has been demonstrated. A section of optical microfiber drawn from silica fiber is employed as the sensing arm. Because of the evanescent field, a slight change of the ambient RI will lead to the variation of the microfiber propagation constant, which will further change the optical length. In order to compensate the variation of the optical length difference, a tunable optical delay line (ODL) is inserted into the other arm. By measuring the delay of the ODL, the ambient RI can be simply demodulated. A high RI sensitivity of about 7159  μm/refractive index unit is achieved at microfiber diameter of 2.0 μm.
URI: https://hdl.handle.net/10356/98012
http://hdl.handle.net/10220/10934
DOI: 10.1364/OL.37.000067
Rights: © 2012 Optical Society of America. This paper was published in Optics Letters and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: [http://dx.doi.org/10.1364/OL.37.000067]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Journal Articles

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