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dc.contributor.authorChong, Wee Keaten
dc.contributor.authorSoh, Yeng Chaien
dc.contributor.authorLi, Xiangen
dc.identifier.citationChong, W. K., Li, X., & Soh, Y. C. (2013). Harnessing spectral property of dual wavelength white LED to improve vertical scanning interferometry. Applied Optics, 52(19), 4652-4662.en
dc.description.abstractUnlike a conventional white light source that emits a continuous and broad spectrum of light, the dual wavelength white light emitting diode (LED) generates white light by mixing blue and yellow lights, so there are two distinct peaks in its intensity spectrum. Prior works had shown that the spectral property of the dual wavelength white LED can affect the vertical scanning interferometry negatively if the spectral effects are not compensated. In this paper, we shall examine this issue by modeling the spectral property and variation of the dual wavelength white LED, followed by investigating its effects on the interference signal of vertical scanning interferometry. Instead of compensating the spectral effects of the dual wavelength white LED, we harness its spectral property to improve the performance of a phase-based height reconstruction algorithm in vertical scanning interferometry.en
dc.relation.ispartofseriesApplied opticsen
dc.rights© 2013 Optical Society of America. This paper was published in Applied Optics and is made available as an electronic reprint (preprint) with permission of Optical Society of America. The paper can be found at the following official DOI: []. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen
dc.titleHarnessing spectral property of dual wavelength white LED to improve vertical scanning interferometryen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.contributor.organizationA*STAR SIMTechen
dc.description.versionPublished versionen
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