Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/98112
Title: A 64×64 1200fps CMOS ion-image sensor with suppressed fixed-pattern-noise for accurate high-throughput DNA sequencing
Authors: Wang, Fei
Yu, Hao
Yeo, Kiat Seng
Guo, Jing
Huang, Xiwei
Yan, Mei
Keywords: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Issue Date: 2014
Source: Huang, X., Wang, F., Guo, J., Yan, M., Yu, H., & Yeo, K. S. (2014). A 64×64 1200fps CMOS ion-image sensor with suppressed fixed-pattern-noise for accurate high-throughput DNA sequencing. 2014 Symposium on VLSI Circuits Digest of Technical Papers.
Conference: 2014 Symposium on VLSI Circuits Digest of Technical Papers
Abstract: A 64×64 CMOS ion-image sensor is demonstrated towards accurate high-throughput DNA sequencing. Dual-mode (pH/image) sensing is performed with ion-sensitive field-effect transistor (ISFET) fabricated in standard CMOS image sensor (CIS) process. After addressing physical locations of DNA slices by optical contact imaging, local pH for one DNA slice can be mapped to its physical address with accurate correlation. Moreover, pixel-to-pixel ISFET threshold voltage mismatch is reduced by correlated double sampling (CDS) readout. Measurements show a sensitivity of 103.8mV/pH and fixed-pattern-noise (FPN) reduction from 4% to 0.3% with speed of 1200fps. .
URI: https://hdl.handle.net/10356/98112
http://hdl.handle.net/10220/38537
DOI: 10.1109/VLSIC.2014.6858409
Schools: School of Electrical and Electronic Engineering 
Rights: © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/VLSIC.2014.6858409].
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:EEE Conference Papers

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