Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/99019
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dc.contributor.authorWang, Zhupingen
dc.contributor.authorMo, Huiyuen
dc.contributor.authorWang, Hanen
dc.contributor.authorWang, Danweien
dc.date.accessioned2013-08-02T04:03:13Zen
dc.date.accessioned2019-12-06T20:02:22Z-
dc.date.available2013-08-02T04:03:13Zen
dc.date.available2019-12-06T20:02:22Z-
dc.date.copyright2012en
dc.date.issued2012en
dc.identifier.citationWang, Z., Mo, H., Wang, H.,& Wang, D. (2012). An affine invariant feature detection method based on SIFT and MSER. 2012 7th IEEE Conference on Industrial Electronics and Applications (ICIEA), 69 - 72.en
dc.identifier.urihttps://hdl.handle.net/10356/99019-
dc.identifier.urihttp://hdl.handle.net/10220/12871en
dc.description.abstractIn this paper, an affine invariance feature detection method based on Scale Invariant Feature Transform (SIFT) and Maximally Stable Extremal Regions (MSER) is proposed. Classical SIFT algorithm is not robust to affine deformations, because it is based on DOG detector which extracts circle regions for keypoint location. In order to overcome this disadvantage, DOG detector in conventional SIFT algorithm is replaced by MSER detector which is robust to affine deformation. Then these regions are normalized and extracted using SIFT. Simulation studies are carried out to show the effectiveness of the proposed method to affine transform in comparison to traditional SIFT algorithm.en
dc.language.isoenen
dc.titleAn affine invariant feature detection method based on SIFT and MSERen
dc.typeConference Paperen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.contributor.conferenceIEEE Conference on Industrial Electronics and Applications (7th : 2012 : Singapore)en
dc.identifier.doihttp://dx.doi.org/10.1109/ICIEA.2012.6360699en
item.grantfulltextnone-
item.fulltextNo Fulltext-
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