Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/99052
Title: Automatic measurements of choroidal thickness in EDI-OCT images
Authors: Tian, Jing
Marziliano, Pina
Baskaran, Mani
Tun, Tin Aung
Aung, Tin
Keywords: DRNTU::Engineering::Electrical and electronic engineering
Issue Date: 2012
Conference: Annual International Conference of the IEEE Engineering in Medicine and Biology Society (34th : 2012 : San Diego, USA)
Abstract: Enhanced Depth Imaging (EDI) optical coherence tomography (OCT) provides high-definition cross-sectional images of the choroid in vivo, and hence is used in many clinical studies. However, measurement of choroidal thickness depends on the manual labeling, which is tedious and subjective of inter-observer differences. In this paper, we propose a fast and accurate algorithm that could measure the choroidal thickness automatically. The lower boundary of the choroid is detected by searching the biggest gradient value above the retinal pigment epithelium (RPE) and the upper boundary is formed by finding the shortest path of the graph formed by valley pixels using dynamic programming. The average of Dice's Coefficient on 10 EDI-OCT images is 94.3%, which shows good consistency of the algorithm with the manual labeling. The processing time for each image is about 2 seconds.
URI: https://hdl.handle.net/10356/99052
http://hdl.handle.net/10220/12526
DOI: 10.1109/EMBC.2012.6347205
Schools: School of Electrical and Electronic Engineering 
Fulltext Permission: none
Fulltext Availability: No Fulltext
Appears in Collections:EEE Conference Papers

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