Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/99052
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dc.contributor.authorTian, Jingen
dc.contributor.authorMarziliano, Pinaen
dc.contributor.authorBaskaran, Manien
dc.contributor.authorTun, Tin Aungen
dc.contributor.authorAung, Tinen
dc.date.accessioned2013-07-30T07:58:08Zen
dc.date.accessioned2019-12-06T20:02:43Z-
dc.date.available2013-07-30T07:58:08Zen
dc.date.available2019-12-06T20:02:43Z-
dc.date.copyright2012en
dc.date.issued2012en
dc.identifier.urihttps://hdl.handle.net/10356/99052-
dc.identifier.urihttp://hdl.handle.net/10220/12526en
dc.description.abstractEnhanced Depth Imaging (EDI) optical coherence tomography (OCT) provides high-definition cross-sectional images of the choroid in vivo, and hence is used in many clinical studies. However, measurement of choroidal thickness depends on the manual labeling, which is tedious and subjective of inter-observer differences. In this paper, we propose a fast and accurate algorithm that could measure the choroidal thickness automatically. The lower boundary of the choroid is detected by searching the biggest gradient value above the retinal pigment epithelium (RPE) and the upper boundary is formed by finding the shortest path of the graph formed by valley pixels using dynamic programming. The average of Dice's Coefficient on 10 EDI-OCT images is 94.3%, which shows good consistency of the algorithm with the manual labeling. The processing time for each image is about 2 seconds.en
dc.language.isoenen
dc.subjectDRNTU::Engineering::Electrical and electronic engineeringen
dc.titleAutomatic measurements of choroidal thickness in EDI-OCT imagesen
dc.typeConference Paperen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.contributor.conferenceAnnual International Conference of the IEEE Engineering in Medicine and Biology Society (34th : 2012 : San Diego, USA)en
dc.identifier.doihttp://dx.doi.org/10.1109/EMBC.2012.6347205en
item.grantfulltextnone-
item.fulltextNo Fulltext-
Appears in Collections:EEE Conference Papers

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