Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/99167
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dc.contributor.authorHuang, Mingen
dc.contributor.authorXiao, Zheen
dc.contributor.authorZheng, Liangen
dc.contributor.authorYang, Jingjingen
dc.contributor.authorNiu, Wenweien
dc.date.accessioned2013-10-31T07:38:39Zen
dc.date.accessioned2019-12-06T20:04:04Z-
dc.date.available2013-10-31T07:38:39Zen
dc.date.available2019-12-06T20:04:04Z-
dc.date.copyright2012en
dc.date.issued2012en
dc.identifier.citationNiu, W., Huang, M., Xiao, Z., Zheng, L., & Yang, J. (2012). Sensitivity enhancement in TE mode nonlinear planar optical waveguide sensor with metamaterial layer. Optik - international journal for light and electron optics, 123(6), 547-552.en
dc.identifier.issn0030-4026en
dc.identifier.urihttps://hdl.handle.net/10356/99167-
dc.description.abstractThe dispersion equation of the TE mode nonlinear planar optical waveguide with metamaterial layer was derived, and the sensitivity of the waveguide sensor was analyzed. The influences of structural parameters on the sensitivity of the waveguide sensor were investigated. We verify that the waveguide sensor with metamaterial layer can dramatically enhance the sensitivity compared with other waveguide sensors.en
dc.language.isoenen
dc.relation.ispartofseriesOptik - international journal for light and electron opticsen
dc.subjectDRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonicsen
dc.titleSensitivity enhancement in TE mode nonlinear planar optical waveguide sensor with metamaterial layeren
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.identifier.doi10.1016/j.ijleo.2011.05.022en
item.fulltextNo Fulltext-
item.grantfulltextnone-
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