Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/99334
Title: Microstructured porous ZnO thin film for increased light scattering and improved efficiency in inverted organic photovoltaics
Authors: Nirmal, Amoolya
Kyaw, Aung Ko Ko
Sun, Xiao Wei
Demir, Hilmi Volkan
Issue Date: 2014
Source: Nirmal, A., Kyaw, A. K. K., Sun, X. W.,& Demir, H. V. (2014). Microstructured porous ZnO thin film for increased light scattering and improved efficiency in inverted organic photovoltaics. Optics Express, 22(S6), A1412-.
Series/Report no.: Optics express
Abstract: Microstructured porous zinc oxide (ZnO) thin film was developed and demonstrated as an electron selective layer for enhancing light scattering and efficiency in inverted organic photovoltaics. High degree of porosity was induced and controlled in the ZnO layer by incorporation of polyethylene glycol (PEG) organic template. Scanning electron microscopy, contact angle and absorption measurements prove that the ZnO:PEG ratio of 4:1 is optimal for the best performance of porous ZnO. Ensuring sufficient pore-filling, the use of porous ZnO leads to a marked improvement in device performance compared to non-porous ZnO, with 35% increase in current density and 30% increase in efficiency. Haze factor studies indicate that the performance improvement can be primarily attributed to the improved light scattering enabled by such a highly porous structure.
URI: https://hdl.handle.net/10356/99334
http://hdl.handle.net/10220/38547
ISSN: 1094-4087
DOI: 10.1364/OE.22.0A1412
Schools: School of Physical and Mathematical Sciences 
School of Electrical and Electronic Engineering 
Rights: © 2014 Optical Society of America. This is the author created version of a work that has been peer reviewed and accepted for publication by Optics express, Optical Society of America. It incorporates referee’s comments but changes resulting from the publishing process, such as copyediting, structural formatting, may not be reflected in this document. The published version is available at: [http://dx.doi.org/10.1364/OE.22.0A1412].
Fulltext Permission: open
Fulltext Availability: With Fulltext
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