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https://hdl.handle.net/10356/99448
Title: | Frequency response of the noise conversion from relative intensity noise to phase noise in the photodetection of an optical pulse train | Authors: | Wu, Kan Ouyang, Chunmei Wong, Jia Haur Aditya, Sheel Shum, Perry Ping |
Keywords: | DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics | Issue Date: | 2011 | Source: | Wu, K., Ouyang, C., Wong, J. H., Aditya, S., & Shum, P. (2011). Frequency Response of the Noise Conversion from Relative Intensity Noise to Phase Noise in the Photodetection of an Optical Pulse Train. IEEE Photonics Technology Letters, 23(8), 468-470. | Series/Report no.: | IEEE photonics technology letters | Abstract: | The frequency response of the noise conversion from the relative intensity noise (RIN) to the phase noise in the photodetection process of an optical pulse train is characterized with pump modulation method. It is found that the conversion ratio from the RIN to the phase noise is not sensitive to the noise power or the incident optical power, but decreases approximately as 1/f with the increase of noise frequency. A new parameter defined as the RF power difference of the noise spurious peaks is proposed and is shown to provide an easy way to estimate the strength of the RIN-to-phase-noise conversion avoiding the need to measure the exact noise spectra of the RIN and the phase noise. | URI: | https://hdl.handle.net/10356/99448 http://hdl.handle.net/10220/17796 |
ISSN: | 1041-1135 | DOI: | 10.1109/LPT.2011.2109060 | Rights: | © 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/LPT.2011.2109060]. | Fulltext Permission: | open | Fulltext Availability: | With Fulltext |
Appears in Collections: | EEE Journal Articles |
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