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dc.contributor.authorTok, Alfred Iing Yoongen
dc.contributor.authorTeo, Edwin Hang Tongen
dc.contributor.authorZhu, Minminen
dc.contributor.authorDu, Zehuien
dc.contributor.authorJing, Linen
dc.identifier.citationZhu, M., Du, Z., Jing, L., Tok, A. I. Y., & Teo, E. H. T. (2015). Optical and electro-optic anisotropy of epitaxial PZT thin films. Applied Physics Letters, 107(3), 031907-.en
dc.description.abstractStrong optical and electro-optic (EO) anisotropy has been investigated in ferroelectric Pb(Zr0.48Ti0.52)O3 thin films epitaxially grown on Nb-SrTiO3 (001), (011), and (111) substrates using magnetron sputtering. The refractive index, electro-optic, and ferroelectric properties of the samples demonstrate the significant dependence on the growth orientation. The linear electro-optic coefficients of the (001), (011), and (111)-oriented PZT thin films were 270.8, 198.8, and 125.7 pm/V, respectively. Such remarkable anisotropic EO behaviors have been explained according to the structure correlation between the orientation dependent distribution, spontaneous polarization, epitaxial strain, and domain pattern.en
dc.relation.ispartofseriesApplied Physics Lettersen
dc.rights© 2015 AIP Publishing LLC. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of AIP Publishing LLC. The published version is available at: []. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.en
dc.titleOptical and electro-optic anisotropy of epitaxial PZT thin filmsen
dc.typeJournal Articleen
dc.contributor.schoolSchool of Electrical and Electronic Engineeringen
dc.contributor.schoolSchool of Materials Science & Engineeringen
dc.description.versionPublished versionen
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