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      Author
      Chi, Dong Zhi (2)
      Lee, Pooi See (2)
      Pey, Kin Leong (2)
      Kon, M. L. (1)Mangelinck, D. (1)Osipowicz, T. (1)Tan, Eu Jin (1)Wang, W. D. (1)Zhang, Y. W. (1)Date
      2005 (2)
      SubjectEngineering (2)... View More

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      On the morphological changes of Ni- and Ni(Pt)-silicides 

      Lee, Pooi See; Pey, Kin Leong; Mangelinck, D.; Chi, Dong Zhi; Osipowicz, T. (2005)
      The issue of agglomeration and layer inversion has remained critical because conductivity of thin silicide films is sensitive to the degradation of the film ...
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      Effects of Si(001) surface amorphization on ErSi2 thin film 

      Tan, Eu Jin; Kon, M. L.; Pey, Kin Leong; Lee, Pooi See; Zhang, Y. W.; Wang, W. D.; Chi, Dong Zhi (2005)
      In a materials study of ErSi2/Si(001) as a potential candidate for Schottky source/drain NMOS application, the properties of ErSi2 thin film were investigated with varying degrees of Si(001) surface amorphization. The ...

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